Fe M2,3 X-ray resonant magnetic reflectivity on epitaxial Fe3-δO4 thin films

Physica B: Condensed Matter

Volumn 345, Issue 1-4, 2004, Pages 157-160

  Telling, N D ^a   Haznar, A ^a,b   Van der Laan, G ^a   Roper, M D ^a   Schedin, F ^c   Thornton, G ^c  

^a DARESBURY LABORATORY   (United Kingdom)

^b INSTITUTE OF LOW TEMPERATURE AND STRUCTURE RESEARCH   (Poland)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Absorption; M edge; Magnetite; Resonant reflectivity; XMCD

Indexed keywords

CRYSTAL STRUCTURE; DATA STORAGE EQUIPMENT; EPITAXIAL GROWTH; FILM GROWTH; MAGNETIC RECORDING; MAGNETIC RESONANCE; MAGNETITE; MAGNETIZATION; MAGNETOELECTRIC EFFECTS; METALLIC FILMS; POLARIZATION; RADIATION EFFECTS; SURFACE STRUCTURE; TRANSITION METALS; X RAY SCATTERING;

M EDGES; RESONANT REFLECTIVITY; X-RAY MAGNETIC CIRCULAR DICHROISM (XMCD); XMCD;

THIN FILMS;

EID: 1242333007     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2003.11.044     Document Type: Conference Paper

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