Characterization of phosphoric acid doped TGS single crystals

Journal of Crystal Growth

Volumn 263, Issue 1-4, 2004, Pages 192-202

  Saxena, Aparna ^a   Gupta, Vinay ^a   Sreenivas, K ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

A1. Crystal morphology; A1. Doping; A1. Optical microscopy; A1. X ray diffraction; A2. Growth from solutions; B2. Ferroelectric materials

Indexed keywords

COERCIVE FORCE; CRYSTAL LATTICES; ELECTROMAGNETIC WAVE POLARIZATION; FERROELECTRIC MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; OPTICAL MICROSCOPY; PERMITTIVITY; PHOSPHORIC ACID; SEMICONDUCTOR DOPING; SOLUTIONS;

CRYSTAL MORPHOLOGY; DOPING; GROWTH FROM SOLUTIONS;

SINGLE CRYSTALS;

EID: 1242331357     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.10.083     Document Type: Article

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