Absolute photometric calibration of large aperture optical systems

Astroparticle Physics

Volumn 20, Issue 6, 2004, Pages 653-659

  Brack, J T ^a   Meyhandan, R ^b   Hofman, G J ^a,d   Matthews, J ^b,c  

^a UNIVERSITY OF COLORADO   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

^c SOUTHERN UNIVERSITY   (United States)

^d TRIUMF   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1242328547     PISSN: 09276505     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.astropartphys.2003.09.004     Document Type: Article

References (8)

1. Privitera P. Pierre Auger Collaboration Nucl. Phys. Proc. 110 Suppl. 2002 487
2. T.C. Larason, S.S. Bruce, A.C. Parr, National Institute of Standards and Technology, Calibration Program, Gaithersburg, MD 20899-2330, "Spectroradiometric Detector Measurements", US Department of Commerce, NIST Special Publication 250-41, 1998
3. NSHU550 UV LED, Nichia America Corp., 181 Metro Drive, Suite 350, San Jose, CA 95110, 408-573-0933
4. UV100 photodiode, UDT Sensors, Inc., Hawthorne, USA
5. Tyvek is a registered trademark of Dupont, USA
6. MX5 CCD camera from Starlite Xpress, Holyport, UK
7. IVC102 charge integrating device, Burr-Brown, Tuscon, USA
8. J.A.J. Matthews, in: Proc. SPIE Astronomical Telescopes and Instrumentation, Waikoloa, Hawaii, USA, 2002