Stress Determination in Textured Thin Films Using X-Ray Diffraction

MRS Bulletin

Volumn 17, Issue 7, 1992, Pages 46-51

  Clemens, B M ^a   Bain, J A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1242327986     PISSN: 08837694     EISSN: 19381425     Source Type: Journal    
DOI: 10.1557/S0883769400041658     Document Type: Article

References (20)

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