On the testability of SDL specifications

Computer Networks

Volumn 44, Issue 5, 2004, Pages 681-700

  Hierons, Rob M ^a   Kim, Tae Hyong ^b   Ural, Hasan ^c  

^a BRUNEL UNIVERSITY   (United Kingdom)

^b Kumoh National Institute of Technology   (South Korea)

^c UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Extended finite state machine; Infeasible path problem; SDL; Test generation

Indexed keywords

AUTOMATION; INFORMATION ANALYSIS; MAPPING;

EXTENDED FINITE STATE MACHINE; INFEASIBLE PATH PROBLEM; SDL; TEST GENERATION;

SOFTWARE ENGINEERING;

EID: 1242321280     PISSN: 13891286     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.comnet.2003.06.001     Document Type: Article

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