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Volumn 2, Issue , 2003, Pages 159-166

Dynamic Characterization of Thermal Interface Material for Electronic Cooling

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; CORRELATION METHODS; FILLERS; HEAT RESISTANCE; HEAT TRANSFER; INTERFACES (MATERIALS); PRODUCT DEVELOPMENT; STANDARDS; THERMAL CONDUCTIVITY; AUTOMATION; ELECTRONICS PACKAGING; FATIGUE OF MATERIALS; INSTRUMENT TESTING; MANUFACTURE; MATERIALS TESTING; STANDARDIZATION; TESTING; THERMAL INSULATING MATERIALS;

EID: 1242309433     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/ipack2003-35073     Document Type: Conference Paper
Times cited : (5)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.