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Volumn 2, Issue , 2003, Pages 435-442
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System-level transient thermal analysis for performance optimization of high power microelectronics
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SOFTWARE;
ELECTRONIC EQUIPMENT TESTING;
ELECTRONICS PACKAGING;
ENERGY DISSIPATION;
FINITE VOLUME METHOD;
HEAT FLUX;
HEAT SINKS;
HEAT TRANSFER;
POWER AMPLIFIERS;
THERMAL CONDUCTIVITY;
HEATING;
MICROELECTRONICS;
MIXED CONVECTION;
OPTIMIZATION;
THERMAL CYCLING;
THERMOANALYSIS;
DEVICE UNDER TEST (DUT);
THERMAL OPTIMIZATION;
DEVICE OPERATIONS;
DEVICE TESTING;
FINITE-VOLUME;
FLOW AND HEAT TRANSFER;
HEATING-COOLING CYCLE;
HIGH-POWER;
NORMAL TEST;
NUMERICAL STUDIES;
OPTIMAL OPERATION;
PEAK TEMPERATURES;
PERFORMANCE OPTIMIZATIONS;
POWER LEVELS;
POWER SOURCES;
STEADY STATE;
SYSTEM DESIGN;
SYSTEM LEVELS;
THERMAL BEHAVIORS;
THERMAL CYCLE;
THERMAL PERFORMANCE;
TIME DURATION;
TRANSIENT THERMAL ANALYSIS;
MICROELECTRONICS;
MATHEMATICAL MODELS;
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EID: 1242309398
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/ipack2003-35213 Document Type: Conference Paper |
Times cited : (2)
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References (9)
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