A shift-invariant wavelet-based method to quantify and identify slight power quality disturbances in power systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5207, Issue 2, 2003, Pages 722-727

  Chen, Xiangxun ^a  

^a CHINA ELECTRIC POWER RESEARCH INSTITUTE   (China)

Author keywords

Basic power quality disturbances; Binary features; Binary decimal conversion identification; Complex biorthogonal wavelet; Shift invariant wavelet based method

Indexed keywords

ELECTRIC IMPEDANCE; FREQUENCIES; MATHEMATICAL MODELS; PROBLEM SOLVING; SIGNAL PROCESSING; WAVELET TRANSFORMS;

BASIC POWER QUALITY DISTURBANCES; BINARY FEATURES; BINARY-DECIMAL CONVERSION IDENTIFICATION; COMPLEX BIORTHOGONAL WAVELET; SHIFT-INVARIANT WAVELET-BASED METHOD;

ELECTRIC POWER SYSTEMS;

EID: 1242308446     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.502521     Document Type: Conference Paper

References (10)

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