Dependence of electronic structure on the grain size in Mn 2O3 nanocrystals

Applied Physics A: Materials Science and Processing

Volumn 78, Issue 4, 2004, Pages 581-584

  Chen, Z W ^a   Zhang, S Y ^a   Tan, S ^a   Wang, J ^a   Jin, S Z ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTRONIC STRUCTURE; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OXIDATION; PARAMAGNETIC RESONANCE; PARTICLE SIZE ANALYSIS; PRECIPITATION (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY RESOLUTION; SCHERRER CONSTANT; X-RAY DIFFRACTION (XRD);

MANGANESE COMPOUNDS;

EID: 1242307367     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-1980-9     Document Type: Article

References (19)

1. R. Uyeda: Prog. Mater. Sci. 35, 1 (1991)
2. S. Fritsch, J. Sarrias, A. Rousset, G.U. Kulkarni: Mater. Res. Bull. 38, 1185 (1998)
3. Z.W. Chen, S.Y. Zhang, S. Tan, F.Q. Li, J. Wang, S.Z. Jin, Y.H. Zhang: J. Cryst. Growth 180, 280 (1997)
4. X.D. Wang, T. Hashizume, H. Shinohara, Y. Saito, Y. Nishina, T. Sakura: Jpn. J. Appl. Phys. 31, L983 (1992)
5. K. Sato, A. Yamamoto, M. Nomura: Jpn. Patent App. No. 90; 35; 915 (1990)
6. M.O. Osmanov: Azerb. Khim. Zh. 24, 1 (1986)
7. L. Hegedus, J.W. Beckman, W.H. Pan, J.P. Solor: European Patent App. No. 345; 695 (1989)
8. Chugai Electric Industrial Co. Ltd.: Jpn. Patent App. No. 82; 209; 833 (1982)
9. Y.P. Liu, Y.T. Qian, Y.H. Zhang, M.W. Zhang, Z.Y. Chen, L. Yang, C.S. Wang, Z.W. Chen; Mater. Lett. 28, 357 (1996)
10. Z.W. Chen, S. Tan, S.Y. Zhang, J. Wang, S.Z. Jin, Y.H. Zhang, H. Sekine; Jpn. J. Appl. Phys. 39, 6293 (2000)
11. F. Buciuman, F. Patcas, R. Craciun, D.R.T. Zahn: Phys. Chem. Chem. Phys. 1, 185 (1999)
12. W.S. Kijlstra, B.K. Poels, A. Bliek, B.M. Weckhuysen, R.A. Schoonheydt: J. Phys. Chem. B 101, 309 (1997)
13. F. Kapteijn, A.D. Van Langeveld, J.A. Moulijn, A. Andreini, M.A. Vuurman, A.M. Turek, J.M. Jehng, I.E. Wachs: J. Catal. 150, 94 (1994)
14. M.C. Bernard, A.H.L. Goff, V.B. Thi, S. Cordoba de Torresi; J. Electrochem. Soc. 140, 3065 (1993)
15. G.H. Wang, M. Han: Prog. Phys. 10, 248 (1990)
16. C.S. Fadley: In: Electron Spectroscopy, ed, by D.A. Shirley (North Holland, Amsterdam 1972) p. 781
17. G.K. Wertheim, S. Hüfner, H.J. Guggenheim: Phys. Rev. B 7, 556 (1973)
18. S.P. Kowalczyk, L. Ley, R.A. Pollak, F.R. McFeely, D.A. Shirley; Phys. Rev. B 7, 4009 (1973)
19. Z.W. Chen, S.Y. Zhang, S. Tan, J. Wang, S.Z. Jin: Mater. Res. Bull. 34, 1583 (1999)