메뉴 건너뛰기




Volumn 26, Issue 4, 2003, Pages 294-304

Partial discharge testing of solder fillets on PCBs in a partial vacuum: New experimental results

Author keywords

High voltage systems; Partial discharges; Printed circuit board; Solder fillets

Indexed keywords

ELECTRIC POTENTIAL; EPOXY RESINS; GLASS FIBERS; PARTIAL DISCHARGES; SIGNAL DETECTION; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE; VACUUM;

EID: 1242286455     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2003.820822     Document Type: Article
Times cited : (16)

References (15)
  • 1
    • 0027683101 scopus 로고
    • High voltages in space: Innovation in space insulation
    • Oct.
    • P. Rustan, H. Garrett, and M. J. Schor, "High voltages in space: Innovation in space insulation," IEEE Trans. Elect. Insul., vol. 28, pp. 855-865, Oct. 1993.
    • (1993) IEEE Trans. Elect. Insul. , vol.28 , pp. 855-865
    • Rustan, P.1    Garrett, H.2    Schor, M.J.3
  • 2
    • 0027642213 scopus 로고
    • HV design of vacuum-insulated power supplies for space applications electrical insulation
    • Aug.
    • M. Gollor and K. Rogalla, "HV design of vacuum-insulated power supplies for space applications electrical insulation," IEEE Trans. on Elect. Insul., vol. 28, pp. 667-680, Aug. 1993.
    • (1993) IEEE Trans. on Elect. Insul. , vol.28 , pp. 667-680
    • Gollor, M.1    Rogalla, K.2
  • 4
    • 0034171728 scopus 로고    scopus 로고
    • The influence of solder fillet geometry on the occurrence of corona discharge during operation between 400 V and 900 V in partial vacuum
    • Apr.
    • M. Materassi, B. D. Dunn, and L. Capineri, "The influence of solder fillet geometry on the occurrence of corona discharge during operation between 400 V and 900 V in partial vacuum," IEEE Trans. Electron. Packag. Manufact., vol. 23, pp. 104-115, Apr. 2000.
    • (2000) IEEE Trans. Electron. Packag. Manufact. , vol.23 , pp. 104-115
    • Materassi, M.1    Dunn, B.D.2    Capineri, L.3
  • 5
    • 24844435075 scopus 로고    scopus 로고
    • Non destructive testing method of welds for applications in vacuum and high voltage
    • Final Rep. Italian Space Agency Project Research Contract ASI I/R/142/01, Dept. Electron. Telecommun., Univ. of Florence, Florence, Italy
    • L. Capineri, "Non destructive testing method of welds for applications in vacuum and high voltage," Final Rep. Italian Space Agency Project Research Contract ASI I/R/142/01, Dept. Electron. Telecommun., Univ. of Florence, Florence, Italy, 2001.
    • (2001)
    • Capineri, L.1
  • 6
    • 0029386273 scopus 로고
    • Digital analysis of partial discharge
    • Oct.
    • E. Gulski, "Digital analysis of partial discharge," IEEE Trans. Elect. Insul., vol. 2, pp. 822-835, Oct. 1995.
    • (1995) IEEE Trans. Elect. Insul. , vol.2 , pp. 822-835
    • Gulski, E.1
  • 8
    • 0029354624 scopus 로고
    • Comment and discussion on digital processing of PD pulses
    • Aug.
    • P. Osvàth, "Comment and discussion on digital processing of PD pulses," IEEE Trans. Dielectrics. Elect. Insul., vol. 2, pp. 685-699, Aug. 1995.
    • (1995) IEEE Trans. Dielectrics. Elect. Insul. , vol.2 , pp. 685-699
    • Osvàth, P.1
  • 9
    • 1242350428 scopus 로고
    • Relazione tecnica finale sui metodi e la strumentazione per prove di scariche parziali
    • L. Capineri, "Relazione tecnica finale sui metodi e la strumentazione per prove di scariche parziali," Int. Rep. Laben-Proel 30 206, 1993.
    • (1993) Int. Rep. Laben-Proel 30 206
    • Capineri, L.1
  • 10
    • 1242283079 scopus 로고    scopus 로고
    • Metodo di controllo non distruttivo di saldature per applicazioni spaziali basato sul fenomeno di scariche corona: Contributo allo sviluppo e verifiche sperimentali
    • Laurea thesis, Univ. of Florence, Florence, Italy
    • S. Pesce, "Metodo di controllo non distruttivo di saldature per applicazioni spaziali basato sul fenomeno di scariche corona: contributo allo sviluppo e verifiche sperimentali," Laurea thesis, Univ. of Florence, Florence, Italy, 1997.
    • (1997)
    • Pesce, S.1
  • 14
    • 24844457983 scopus 로고    scopus 로고
    • Sistema di misura automatico di scariche parziali di oggetti campione in vuoto
    • Laurea thesis, Univ. of Florence, Florence, Italy
    • G. Dainelli, "Sistema di misura automatico di scariche parziali di oggetti campione in vuoto," Laurea thesis, Univ. of Florence, Florence, Italy, 2000.
    • (2000)
    • Dainelli, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.