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Volumn 263, Issue 1-4, 2004, Pages 273-282

A two-stage technique for single crystal growth of HgCdTe using a pressurized Bridgman method

Author keywords

A1. Low temperature growth; A2. Pressurized Bridgman; A2. Two stage technique; B1. Large diameter HgCdTe

Indexed keywords

CRYSTAL STRUCTURE; INGOTS; LOW TEMPERATURE PHENOMENA; MERCURY COMPOUNDS; PRESSURIZATION; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL);

EID: 1242263863     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.11.077     Document Type: Article
Times cited : (6)

References (10)
  • 3
    • 9944246772 scopus 로고
    • Advanced method for preparation and characterization of infrared detector materials
    • S.L. Lehoczky, F.R. Szofran, et al., Advanced method for preparation and characterization of infrared detector materials, Final Report NASA-CR-161598, 1980.
    • (1980) Final Report , vol.NASA-CR-161598
    • Lehoczky, S.L.1    Szofran, F.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.