Noncontact measurement of moisture in layered dielectrics from microwave reflection spectroscopy using an inverse technique

IEEE Transactions on Microwave Theory and Techniques

Volumn 52, Issue 1 I, 2004, Pages 76-82

  Thakur, Kailash Prasad ^a   Holmes, Wayne S ^a  

^a CALLAGHAN INNOVATION   (New Zealand)

Author keywords

Inhomogeneous dielectrics; Inverse problem; Least squares method; Moisture measurement

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE REFLECTION; INVERSE PROBLEMS; ITERATIVE METHODS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; MICROWAVE MEASUREMENT; MOISTURE; MULTILAYERS; SPECTROSCOPY;

FRESNELS EQUATIONS; INHOMOGENEOUS DIELECTRICS; LAYERED DIELECTRICS; MICROWAVE REFLECTION SPECTROSCOPY; MOISTURE MEASUREMENT;

MICROSENSORS;

EID: 1242263478     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.821243     Document Type: Article

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