Calculating ratios of harmonically related, complex signals with application to nonlinear large-signal scattering parameters

60th ARFTG Conference Digest: Measurements Needs for Emerging Technologies, ARFTG 2002

Volumn , Issue , 2002, Pages 113-122

  Jargon, J ^a   DeGroot, D ^a   Gupta, K C ^b   Cidronali, A ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

^c UNIVERSITY OF FLORENCE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX SIGNAL; NONLINEAR LARGE-SIGNAL SCATTERING PARAMETERS; PHASE RELATIONSHIPS; TIME INVARIANTS;

SCATTERING PARAMETERS;

EID: 12344324166     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGF.2002.1218694     Document Type: Conference Paper

References (6)

1. J. Verspecht, D. Schreurs, A. Barel, and B. Nauwelaers, "Black Box Modelling of Hard Nonlinear Behavior in the Frequency Domain," IEEE MTT-S International Microwave Symposium Digest, pp. 1735-1738, San Francisco, CA, Jun. 1996.
2. J. Verspecht and P. Van Esch, "Accurately Characterizing Hard Nonlinear Behavior of Microwave Components with the Nonlinear Network Measurement System: Introducing 'Nonlinear Scattering Functions'", Proceedings of the 5th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits, pp. 17-26, Duisburg, GERMANY, Oct. 1998.
3. J. A. Jargon, K. C. Gupta, D. Schreurs, K. A. Remley, and D. C. DeGroot, "A Method of Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements," 58th ARFTG Conference Digest, pp. 35-48, San Diego, CA, Nov. 2001.
4. J. A. Jargon, K. C. Gupta, D. Schreurs, and D. C. DeGroot, "Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements," Proceedings of the XXVIIth General Assembly of the International Union of Radio Science, CD-ROM A1.O.6, Maastricht, the NETHERLANDS, Aug. 2002.
5. A. Cidronali, G. Collodi, A. Santarelli, G. Vannini, and G. Manes, "Millimeter-Wave FET Modeling Using On-Wafer Measurements and EM Simulation," IEEE Transactions on Microwave Theory and Techniques, vol. 50, no. 2, pp. 425-432, Feb. 2002.
6. A. Cidronali, G. Collodi, C. Toccafondi, R. Cignani, A. Santarelli, G. Vannini, and F. Filicori, "A Distributed Approach for the Characterization of Parasitic Networks in Electron Device Modeling," GAAS 2002, pp. 149-152, Milan, Italy, Sep. 2002.