Dependence of magnetoimpedance effect on nanocrystalline structure of Fe-based amorphous ribbons

Physica Status Solidi C: Conferences

Volumn 1, Issue 12, 2004, Pages 3632-3635

  Rahman, I Z ^a   Kamruzzaman, Md ^a   Rahman, M A ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY; SENSORS; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS RIBBONS; MAGNETOIMPEDANCE RATIO (MIR); METALLIC GLASS RIBBONS;

AMORPHOUS MATERIALS;

EID: 12344287267     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200405520     Document Type: Conference Paper

References (7)

1. Y. Yoshizawa, S. Oguma, and K. J. Yamauchi, Appl. Phys. 64, 6044 (1988).
2. G. Herzer, IEEE Trans. Magnetics 26, 1397 (1990).
3. Md. Kamruzzaman, I. Z. Rahman, and M. A. Rahman, J. Magn. Magn. Mater. 262(1), 162 (2003).
4. E. Michael, M. McHenry, A. Willard, and D. E. Laughlin, Prog. Mater. Sci. 44, 291 (1999).
5. T. H. Noh, M. B. Lee, H. J. Kim, and I. K. Kang, J. Appl. Phys. 67, 5568 (1990).
6. H. Lee, Yong-Kook Kim, and Seong-Cho Yu, phys. stat. sol. (a) 189, 649 (2002).
7. G. Herzer, J. Magn. Magn. Mater. 157/158, 133 (1996).