The effect of different oxidation routines on the properties of surface oxidised epitaxial NiO layers on biaxially textured Ni tapes

Physica C: Superconductivity and its Applications

Volumn 372-376, Issue PART 2, 2002, Pages 863-865

  Woodcock, T G ^a   Abell, J S ^a   Shields, T C ^a   Hall, M G ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Biaxial; EBSD; NiO; SOE

Indexed keywords

BACKSCATTERING; DEPOSITION; ELECTRON DIFFRACTION; FURNACES; IMAGE ANALYSIS; NICKEL; OXIDATION; OXYGEN; QUENCHING; TEXTURES; X RAY DIFFRACTION ANALYSIS;

SURFACE OXIDATION EPITAXY (SOE);

EPITAXIAL GROWTH;

EID: 12344279191     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)00874-2     Document Type: Article

References (4)