메뉴 건너뛰기




Volumn 38, Issue 10, 1991, Pages 1133-1144

An Analysis Methodology to Identify Dominant Noise Sources in D/A and A/D Converters

Author keywords

[No Author keywords available]

Indexed keywords


EID: 12344270469     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/31.97533     Document Type: Article
Times cited : (18)

References (16)
  • 3
    • 0015110304 scopus 로고
    • Computationally efficient electronic-circuit noise calculations
    • Aug.
    • R. Rohrer, L. Nagel, R. Meyer, and L. Weber, “Computationally efficient electronic-circuit noise calculations,” IEEE J. Solid-State Circuits, vol. SC-6, pp. 204–213, Aug. 1971.
    • (1971) IEEE J. Solid-State Circuits , vol.SC-6 , pp. 204-213
    • Rohrer, R.1    Nagel, L.2    Meyer, R.3    Weber, L.4
  • 4
    • 0014735936 scopus 로고
    • Low-frequency noise sources in bipolar junction transistors
    • Feb.
    • R. C. Jaeger and J. Brodersen, “Low-frequency noise sources in bipolar junction transistors,” IEEE Trans. Electron Devices, vol. ED-17, pp. 128–134, Feb. 1970.
    • (1970) IEEE Trans. Electron Devices , vol.ED-17 , pp. 128-134
    • Jaeger, R.C.1    Brodersen, J.2
  • 6
    • 0015639577 scopus 로고
    • Computer simulation of 1/f noise performance of electronic circuits
    • June
    • R. G. Meyer, L. Nagel, and S. K. Lui, “Computer simulation of 1/f noise performance of electronic circuits,” IEEE J. Solid-State Circuits, vol. SC-8, pp. 237–240, June 1973.
    • (1973) IEEE J. Solid-State Circuits , vol.SC-8 , pp. 237-240
    • Meyer, R.G.1    Nagel, L.2    Lui, S.K.3
  • 7
    • 0016664679 scopus 로고
    • Noise characteristics of current mirror sinks/sources
    • Dec.
    • A. Bilotti and E. Mariani, “Noise characteristics of current mirror sinks/sources,” IEEE J. Solid-State Circuits, vol. SC-10, pp. 516–523, Dec. 1975.
    • (1975) IEEE J. Solid-State Circuits , vol.SC-10 , pp. 516-523
    • Bilotti, A.1    Mariani, E.2
  • 8
    • 0023568870 scopus 로고
    • Simulation-oriented noise model for MOS devices
    • Dec.
    • G. Nicollini, D. Pancini, and S. Pernici, “Simulation-oriented noise model for MOS devices,” IEEE J. Solid-State Circuits, vol. SC-22, pp. 1209–1212, Dec. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.SC-22 , pp. 1209-1212
    • Nicollini, G.1    Pancini, D.2    Pernici, S.3
  • 9
    • 0024610768 scopus 로고
    • Noise performance of operational amplifier circuits
    • Feb.
    • F. N. Trofimenkoff and O. A. Onwuachi, “Noise performance of operational amplifier circuits,” IEEE Trans. Education, vol. E-32, pp. 12–16, Feb. 1989.
    • (1989) IEEE Trans. Education , vol.E-32 , pp. 12-16
    • Trofimenkoff, F.N.1    Onwuachi, O.A.2
  • 10
    • 0016039363 scopus 로고
    • Noise-effects on analog to digital conversion accuracy—Part 1
    • Mar.
    • B. M. Gordon, “Noise-effects on analog to digital conversion accuracy—Part 1,” Computer Design, pp. 65–76, Mar. 1974.
    • (1974) Computer Design, pp , pp. 65-76
    • Gordon, B.M.1
  • 11
    • 84939053068 scopus 로고
    • Noise-effects on analog to digital conversion accuracy—Part 2
    • Apr.
    • _, “Noise-effects on analog to digital conversion accuracy—Part 2,” Computer Design, pp. 137–145, Apr. 1974.
    • (1974) Computer Design, pp , pp. 137-145
  • 13
    • 0023250221 scopus 로고
    • Addition of excess noise in SPICE circuit simulations
    • G. J. Scott and T. M. Chen, “Addition of excess noise in SPICE circuit simulations,” in Proc. IEEE Southeastoon Conf., vol. 1, pp. 186–190, 1987.
    • (1987) Proc. IEEE Southeastoon Conf. , vol.1 , pp. 186-190
    • Scott, G.J.1    Chen, T.M.2
  • 14
    • 84941454512 scopus 로고
    • National Semiconductor Corp., Linear Databook, vol. 2, 1988.
    • (1988) Linear Databook , vol.2
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.