Now you see it and now you don't

IEEE Microwave Magazine

Volumn 5, Issue 4, 2004, Pages 32-34

  Bansal, Rajeev ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARCODE SCANNING; DATA CAPTURE TECHNOLOGY; MICROWAVE SURFING; RADIO FREQUENCY IDENTIFICATION (RFID);

BAR CODES; BROADCASTING; CONTAMINATION; CUSTOMER SATISFACTION; JAMMING; MICROPROCESSOR CHIPS; REAL TIME SYSTEMS; TRANSPONDERS; WEAR OF MATERIALS;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 12344267587     PISSN: 15273342     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MMW.2004.1380274     Document Type: Review

References (7)

1. RSA Security Web site. Available http://www.rsasecurity.com
2. The Association for Automatic Identification and Data Capture Technologies Web site. Available: http://www.aimglobal.org/technologies/rfid/
3. R. Bansal, "Coming soon to a Wal-Mart near you," IEEE Antennas and Propagat. Mag., vol. 45, no. 6, pp. 105-106, Dec. 2003.
4. M. Geewax, "Privacy advocates assail radio-ID tags; Companies defend technology," CIO Today, 16 July 2004. [Online]. Available: http://cio-today.newsfactor.com
5. Proc. RFID Privacy Workshop @ MIT: 15 Nov. 2003. [Online]. Available: http://www.rfidprivacy.org/agenda.php
6. J. Kumagai and S. Cherry, "Sensors and sensibility," IEEE Spectr., vol. 41, pp. 22-28, July 2004.
7. R. Bansal, "Knock on wood," IEEE Microwave Mag., vol. 5, no. 1, p. 38, Mar. 2004.