ICP-MS analysis of high purity molybdenum used as SI-traceable standard of high metrological quality

Journal of Analytical Atomic Spectrometry

Volumn 20, Issue 1, 2005, Pages 28-34

  Kipphardt, Heinrich ^a   Czerwensky, Michael ^a   Matschat, Ralf ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INDUCTIVELY COUPLED PLASMA; LITHIUM; MEASUREMENT THEORY; MOLYBDENUM; NICKEL; PROTECTIVE COATINGS; REDUCTION; SILICON; SODIUM; STANDARDS; TRACE ANALYSIS;

BLANK REDUCTION; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICP-MS); METROLOGICAL QUALITY; TECHNICAL ASPECTS;

MASS SPECTROMETRY;

EID: 12344266035     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b409973g     Document Type: Article

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