ISO/IEC 9126 quality characteristics considering the application fields and the test phases of embedded software

Proceedings of the International Conference on Software Engineering Research and Practice, SERP'04

Volumn 2, Issue , 2004, Pages 628-632

  Choi, Junga ^a   Park, Sunyoung ^a   Chong, Kiwon ^a  

^a Soongsil University   (South Korea)

Author keywords

Application field; Embedded software; ISO IEC quality characteristics; Test phase

Indexed keywords

COMPUTER SOFTWARE; COMPUTER SOFTWARE MAINTENANCE; EMBEDDED SYSTEMS; INTERFACES (COMPUTER); QUALITY ASSURANCE; RANDOM ACCESS STORAGE; RELIABILITY; SENSORS;

APPLICATION FIELDS; EMBEDDED SOFTWARE; ISO/IEC QUALITY CHARACTERISTICS; TEST PHASES;

COMPUTER AIDED SOFTWARE ENGINEERING;

EID: 12344263068     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Rajesk K. Gupt, "Introduction to Embedded Systems", ICS 212, Winter Workshop, 2002
2. ETRI, "Embedded Software Programming", 2003
3. Bart Broekman, Edwin Notenboom, "Testing Embedded Software", Addison-Wesley, 2003
4. Hae-Sool Yang, Ha-Yong Lee, "Development of Evaluation Model for Embeddd Software", Korea Information Processing Society, Autumn Conference Vol.9, No.2, 2002
5. Dae-Ho Ryoo, Joong-Soon Jang, "Reliability Assessment of Embedded Systems in Electronic Appliances", Journal of the Korean Institute of Plant Engineering, Vol.6, No.1, Mar 2001
6. ISO, ISO/IEC 9126 : Information Technology-Software Quality Characteristics and Metrics, 1998