Motion stage design with scanning-by-probe AFM for imaging nanocrystals on sapphire surface

Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao

Volumn 25, Issue 3, 2004, Pages 257-265

  Huang, Yi Cheng ^a   Lin, Mou Sheng ^a   Liu, Che Ming ^b   Chen, Jyh Chen ^b  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

Mg Al spinel nanocrystal; Piezoelectric motion stage; Scanning by probe atomic force microscopy

Indexed keywords

EID: 12344255028     PISSN: 02579731     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)