Error rate in current-controlled logic processors with shot noise

Fluctuation and Noise Letters

Volumn 4, Issue 1, 2004, Pages

  Kim, Jong U ^a   Kish, Laszlo B ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Bandwidth; Nanoelectronics; Shannon information; Single electron transistor

Indexed keywords

EID: 12344253927     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219477504001689     Document Type: Article

References (3)

1. L. B. Kish, End of Moore's law: thermal (noise) death of integration in micro and nano electronics, Phys. Lett. A 305 (2002) 144-149.
2. Z. Gingl, L.B. Kiss and F. Moss, Non-dynamical Stochastic resonance, Europhys. Lett. 29 (1995) 191.
3. N. G. de Bruijn, Asymptotic Methods in Analysis, 2nd Ed., North-Holland Publishing, Amsterdam (1961) 25-28.