Method of Foight-approximating for determination of nanostructure parameters by X-ray lines profile

Zavodskaya Laboratoriya. Diagnostika Materialov

Volumn 70, Issue 11, 2004, Pages 29-33

  Ivanov, A N ^a   Shelehov, E V ^a   Kuz'mina, E N ^a  

^a NONE

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EID: 12244312564     PISSN: 03214265     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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