Elemental distribution analysis of positive electrode material for a nickel metal hydride battery

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 609-613

  Takanashi, K ^a   Yoshida, M ^a   Sakamoto, T ^b   Ono, N ^a   Tanaka, Y ^a   Owari, M ^a,b   Nihei, Y ^c  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Additives; Focused ion beam; Ni MH battery; ToF SIMS

Indexed keywords

ADDITIVES; COBALT; ELECTRIC BATTERIES; ELECTRON BEAMS; ION BEAMS; MICROMETERS; NICKEL COMPOUNDS; SURFACE CHEMISTRY;

ELEMENTAL DISTRIBUTION ANALYSIS;

ELECTROCHEMICAL ELECTRODES;

EID: 12244299826     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00776-6     Document Type: Conference Paper

References (6)

1. Sakamoto T., Cheng Z., Takahashi M., Kuramoto Y., Owari M., Nihei Y. J. Surf. Anal. 5:1999;150.
2. T. Sakamoto, K. Takanashi, Zh.H. Cheng, N. Ono, H. Wu, M. Owari, Y. Nihei, in: D.B. Williams, R. Shimizu (Eds.), Microbeam Analysis 2000, Institute of Physics Conference Series Number 165, p. 335.
3. Takanashi K., Wu H., Kuramoto Y., Cheng Zh.H., Sakamoto T., Owari M., Nihei Y. Surf. Interface Anal. 30:2000;493.
4. Satoh H., Owari M., Nihei Y. J. Vac. Sci. Technol. B. 6:1988;915.
5. Owari M., Sakamoto T., Takahashi M., Cheng Z., Kuramoto Y., Nihei Y. J. Surf. Anal. 5:1999;356.
6. Yano M., Ogasawara T., Baba Y., Tadokoro M., Nakahori S. Electrochemistry. 69(11):2001;848.