Microstructures and IR spectra of long amorphous SiO 2 /Si nanowires

Applied Surface Science

Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 231-235

  Noda, T ^a   Suzuki, H ^a   Araki, H ^a   Yang, W ^a   Shi, Ying ^b   Tosa, M ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Amorphous SiO 2 Si nanowires; IR spectrum; Thermal gradient evaporation method

Indexed keywords

AMORPHOUS SILICON; EVAPORATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; SPECTRUM ANALYSIS; STRUCTURE (COMPOSITION);

AMORPHOUS SIO2/SI NANOWIRES; DISORDERED STRUCTURES; THERMAL GRADIENT EVAPORATION METHOD; THERMAL GRADIENT EVPORATION METHOD;

SILICA;

EID: 12244295508     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.075     Document Type: Conference Paper

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