An Auger microscopy study of the meeting and interdiffusion of pure Pb and Bi adsorbed layers on polycrystalline Cu

Surface Science

Volumn 575, Issue 1-2, 2005, Pages 69-74

  Monchoux, J P ^a   Chatain, D ^a   Wynblatt, P ^b  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Auger electron spectroscopy; Bismuth; Copper; Lead; Surface diffusion

Indexed keywords

ADSORPTION; ANNEALING; AUGER ELECTRON SPECTROSCOPY; BISMUTH; COPPER; DEPOSITION; DIFFUSION; EVAPORATION; LEAD; SCANNING ELECTRON MICROSCOPY; THERMOCOUPLES; TWO DIMENSIONAL;

AUGER MICROSCOPY; INTERDIFFUSION COEFFICIENTS; SCANNING AUGER MICROPROBE (SAM); SURFACE DIFFUSION;

POLYCRYSTALLINE MATERIALS;

EID: 12244295494     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.11.004     Document Type: Article

References (11)

1. R. Gomer Rep. Prog. Phys. 53 1990 917
2. E.G. Seebauer, and C.E. Allen Prog. Surf. Sci. 49 1995 265
3. C. Cohen, Y. Girard, P. Leroux-Hugon, A. L'Hoir, J. Moulin, and D. Schmaus Europhys. Lett. 24 1993 767
4. G. Prévot, C. Cohen, J. Moulin, and D. Schmaus Surf. Sci. 421 1999 364
5. J. Moon, J. Lowekamp, P. Wynblatt, S. Garoff, and R. Suter Surf. Sci. 488 2001 73
6. J. Moon, P. Wynblatt, S. Garoff, and R. Suter Surf. Sci. 599 2004 160
7. D. Chatain, V. Ghetta, and P. Wynblatt Interface Sci. 12 2004 7
8. M.P. Seah D. Briggs M.P. Seah Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy 1983 John Wiley & Sons Chichester 181
9. C. Nagl, O. Haller, M. Platzgummer, P. Schmid, and P. Varga Surf. Sci. 321 1994 237
10. Y. Adda, and J. Philibert La diffusion dans les solides 1966 Institut national des sciences et techniques nucléaires Saclay
11. D. Chatain, P. Wynblatt, and G.S. Rohrer Scripta Mater. 50 2004 565