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Applied Surface Science

Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 256-260

First steps in the growth of Cu thin films on the five-fold surface of the icosahedral Al-Cu-Fe quasicrystal

(6) Sharma, H R a,b Shimoda, M b Fournee V c Ross, A R d Lograsso, T A d Tsai, A P a,b,e

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c CNRS (France)

d IOWA STATE UNIVERSITY (United States)

e TOHOKU UNIVERSITY (Japan)

Author keywords

Alloys; Copper; Epitaxy; Metallic surfaces; Scanning tunneling microscopy

Indexed keywords

ALLOYS; COPPER; EPITAXIAL GROWTH; FILM GROWTH; INTERMETALLICS; QUASICRYSTALS; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTIES;

METALLIC SURFACES; QUASIPERIODICITY; ROTATIONAL SYMMETRIES;

THIN FILMS;

EID: 12244293411 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.09.042 Document Type: Conference Paper

Times cited : (7)

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