Effect of ultra-thin buffer on the structure of highly mismatched epitaxial ZnO during sputter growth

Applied Surface Science

Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 261-265

  Kim, I W ^a   Kim, H S ^a   Kwon, Y B ^a   Doh, S J ^a   Kim, C C ^a   Je, Jung Ho ^a   Ruterana, P ^b   Nouet, G ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b UNIVERSITÉ DE CAEN   (France)

Author keywords

Low temperature Buffer; Sapphire; Strain; ZnO

Indexed keywords

INTERFACES (MATERIALS); LOW TEMPERATURE EFFECTS; MICROSTRUCTURE; SAPPHIRE; SPUTTER DEPOSITION; STRAIN; SUBSTRATES; X RAY SCATTERING;

LOW TEMPERATURE BUFFERS; MICROSTRUCTURAL EVOLUTION; REAL TIME SYNCHROTRON X-RAY SCATTERING; ZNO;

ZINC OXIDE;

EID: 12244292728     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.088     Document Type: Conference Paper

References (11)

1. P. Zu, Z.K. Tang, G.K.L. Wong, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa Solid State Commun. 103 1997 459
2. T. Nakamura, Y. Yamada, T. Kusumori, H. Minoura, and H. Muto Thin Solid Films 411 2002 60
3. Y. Chen, H.J. Ko, S.K. Hong, and T. Yao Appl. Phys. Lett. 76 2000 559
4. F. Vigue, P. Vennegues, C. Deparis, S. Vezian, M. Laugt, and J.P. Faurie J. Appl. Phys. 90 2001 5115
5. E.M. Kaidashev, M. Lorenz, H. von Wenckstern, A. Rahm, H. Hochmuth, and M. Grundmann Appl. Phys. Lett. 82 2003 3901
6. S.I. Park, T.S. Cho, S.J. Doh, J.L. Lee, and J.H. Je Appl. Phys. Lett. 77 2000 349
7. I. Okubo, Y. Matsumoto, A. Ohtomo, T. Ohnishi, H. Koinuma, and M. Kawasaki Appl. Surf. Sci. 159-160 2000 514
8. D.Y. Noh, Y. Ywu, H.K. Kim, and M. Hong Phys. Rev. B 51 1995 4441
9. P.M. Reimer, H. Zabel, C.P. Flynn, and J.A. Dura Phys. Rev. B 45 1992 11426
10. D.K. Bowen, and B.K. Tanner High Resolution X-ray Diffractometry and Topography 1998 Taylor & Francis London Chapter 6
11. R. Hull, J.M. Gibson, and D.A. Smith Initial stages of epitaxial growth MRS Proceedings, vol. 94 Anaheim 1987