SIMS depth profiling analysis of electrical arc residues in fire investigation

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 779-784

  Chen, C Y ^a   Ling, Y C ^a   Wang, J T ^b   Chen, H Y ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b CENTRAL POLICE UNIVERSITY   (Taiwan)

Author keywords

Arc beads; Electric short circuit; Fire; SIMS

Indexed keywords

CHLORINE COMPOUNDS; ELECTRIC ARCS; POSITIVE IONS; PROFILOMETRY; SECONDARY ION MASS SPECTROMETRY; SHORT CIRCUIT CURRENTS;

ELECTRIC ARC RESIDUES;

CARBON INORGANIC COMPOUNDS;

EID: 12244288886     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00817-6     Document Type: Conference Paper

References (4)

1. Bernard B. Fire Arson Invest. 44(4):1994;40-43.
2. Howitt D.G. Fire Arson Invest. 48(3):1998;34-39.
3. Anderson R.N. J. Forensic Sci. 34(3):1989;633-637.
4. C.Y. Chen, Y.C. Ling, J.F. Hwang, J.H. Lee, M.L. Wen, C. Hwang, G.C. Lin, Unpublished.