Growth study of Cu/Pd(1 1 1) by RHEED and XPS

Surface Science

Volumn 575, Issue 1-2, 2005, Pages 217-222

  De Siervo, A ^a,c   Paniago, R ^b   Soares, E A ^b   Pfannes, H D ^b   Landers, R ^a,c   Kleiman, G G ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

Alloying; Copper; Low index single crystal surfaces; Molecular beam epitaxy; Palladium; Reflection high energy electron diffraction (RHEED)

Indexed keywords

ALLOYING; CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; MONOLAYERS; PALLADIUM; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

LATTICE MISFIT; LOW INDEX SINGLE CRYSTAL SURFACES; ROOM TEMPERATURE; SURFACE ALLOYING;

COPPER;

EID: 12244278287     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.11.028     Document Type: Article

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