Chemical state analysis of ZnO/Ag film interface utilizing the matrix effect

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 863-866

  Yamamoto, Y ^a   Hayashi, Y ^a   Tachibana, Y ^a   Shimodaira, N ^a   Kudo, M ^b  

^a ASAHI GLASS CO LTD   (Japan)

^b SEIKEI UNIVERSITY   (Japan)

Author keywords

Interface; Ion implant; Matrix effect; Oxidization; SIMS; ZnO Ag

Indexed keywords

INTERFACES (MATERIALS); ION BOMBARDMENT; ION IMPLANTATION; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY;

MATRIX EFFECT;

OXIDATION;

EID: 12244267313     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00827-9     Document Type: Conference Paper

References (2)

1. A. Benninghoven, F.G. Rüdenauer, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry, Wiley, New York, 1987.
2. Maul J., Wittmaack K. Surf. Sci. 47:1975;363.