Calculation of pressure distribution in EHD point contacts from experimentally determinated film thickness

Tribology International

Volumn 38, Issue 4, 2005, Pages 391-401

  Molimard, J ^a   Querry, M ^c   Vergne, P ^b   Krupka, I ^c   Hartl, M ^c  

^a CENTRE SMS   (France)

^b UNIVERSITÉ DE LYON   (France)

^c BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

EHL; Inverse analysis; Pressure distribution

Indexed keywords

CONCENTRATION (PROCESS); ELECTROHYDRODYNAMICS; FAST FOURIER TRANSFORMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFEROMETRY; PARAMETER ESTIMATION; STRESS ANALYSIS; THICK FILMS;

FREQUENCY SHIFTS; INVERSE ANALYSIS; MICROTRANSDUCERS; OPTICAL INTERFEROMETRY;

PRESSURE DISTRIBUTION;

EID: 12244260379     PISSN: 0301679X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.triboint.2003.11.011     Document Type: Article

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