Effect of crystallinity on the transport properties of nd 0.67Sr 0.33Mno 3 thin films

Applied Physics Letters

Volumn 84, Issue 7, 2004, Pages 1147-1149

  Wang, H ^a   Zhang, X ^a   Hundley, M F ^a   Thompson, J D ^a   Gibbons, B J ^a   Lin, Y ^a   Arendt, P N ^a   Foltyn, S R ^a   Jia, Q X ^a   MacManus Driscoll, J L ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITY; SELECTED AREA DIFFRACTION (SAD);

ELECTRIC CONDUCTIVITY OF SOLIDS; FILM GROWTH; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; INTERFACES (MATERIALS); LATTICE CONSTANTS; MAGNETIZATION; MAGNETOMETERS; PEROVSKITE; PULSED LASER DEPOSITION; SINGLE CRYSTALS; SQUIDS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 12144288381     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1646747     Document Type: Article

References (15)

1. R. von Helmolt, J. Wecker, B. Holzapfel, L. Schultz, and K. Sammer, Phys. Rev. Lett. 71, 2331 (1993).
2. S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastmacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994).
3. Y. Tokura and N. Nagaosa, Science 288, 462 (2000).
4. Y. Tomioka, A. Asamitsu, and Y. Tokura, Phys. Rev. B 63, 024421 (2001).
5. J. Heremans, J. Phys. D 26, 1149 (1993).
6. S. Jin, M. McCormack, T. H. Tiefel, and R. Ramesh, J. Appl. Phys. 76, 6929 (1994).
7. R. Shreekala, M. Rajeswari, K. Ghosh, A. Goyal, J. Y. Gu, C. Kwon, Z. Trajanovic, T. Boettcher, R. L. Greene, R. Ramesh, and T. Venkatesan, Appl. Phys. Lett. 72, 282 (1997).
8. Z. W. Dong, R. Ramesh, T. Venkatesan, Mark Johnson, Z. Y. Chen, S. R. Pai, V. Talyansky, R. P. Sharma, R. Shreekala, C. J. Lobb, and R. L. Greene, Appl. Phys. Lett. 71, 1718 (1997).
9. C. Kown, M. C. Robson, K.-C. Kim, J. Y. Ou, S. E. Lofland, S. M. Bhagat, Z. Trajanovic, M. Rajeswari, T. Venkatesan, A. R. Kratz, R. D. Gomez, and R. Ramesh, J. Magn. Magn. Mater. 172, 229 (1997).
10. E. Gommert, H. Cerva, J. Wecker, and K. Samwer, J. Appl. Phys. 85, 5417 (1999).
11. H. S. Wang, Qi Li, Kai Liu, and C. L. Chien, Appl. Phys. Lett. 74, 2212 (1999).
12. A. J. Millis, T. Darling, and A. Migliori, J. Appl. Phys. 83, 1588 (1998).
13. Z. W. Dong, S. P. Pai, R. Ramesh, T. Venkatesan, Mark Johnson, Z. Y. Chen, A. Cavanaugh, Y. G. Zhao, X. L. Jiang, R. P. Sharma, S. Ogale, and R. L. Greene, J. Appl. Phys. 83, 6780 (1998).
14. G. C. Xiong, Q. Li, H. L. Lu, R. L. Greene, and T. Venkatesan, Appl. Phys. Lett. 66, 1689 (1995).
15. L. M. Wang, H. H. Sung, B. T. Su, H. C. Yang, and H. E. Horng, Appl. Phys. Lett. 88, 4236 (2000).