Time-of-Flight Secondary Ion Mass Spectrometry of Perfluorinated Polyethers

Analytical Chemistry

Volumn 62, Issue 13, 1990, Pages 1275-1284

  Bletsos, Ioannis V ^a   Hercules, David M ^b   Fowler, David ^c   vanLeyen, Dieter ^d   Benninghoven, Alfred ^d  

^a DUPONT COMPANY   (United States)

^b UNIVERSITY OF PITTSBURGH   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

^d UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11944274331     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00212a015     Document Type: Article

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