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Volumn 40, Issue 1, 2005, Pages 286-292

A 0.9-V 1T1C SBT-based embedded nonvolatile FeRAM with a reference voltage scheme and multilayer shielded bit-line structure

Author keywords

Ferroelectric; Imprint; Memory; Nonvolatile; One transistor one capacitor (1T1C); Reference voltage

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAPACITANCE; CAPACITORS; ELECTRIC POTENTIAL; FERROELECTRIC DEVICES; LSI CIRCUITS; MULTILAYERS; PRODUCT DESIGN; SCANNING ELECTRON MICROSCOPY; TRANSISTORS;

EID: 11944273158     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.837967     Document Type: Conference Paper
Times cited : (12)

References (5)
  • 1
    • 0033280506 scopus 로고    scopus 로고
    • A 3.3-V 4-Mb nonvolatile ferroelectric RAM with a selectively-driven double-pulsed plate read/write-back scheme
    • Y. Chung et al., "A 3.3-V 4-Mb nonvolatile ferroelectric RAM with a selectively-driven double-pulsed plate read/write-back scheme," in Symp. VLSI Circuits Dig. Tech. Papers, 1999, pp. 97-98.
    • (1999) Symp. VLSI Circuits Dig. Tech. Papers , pp. 97-98
    • Chung, Y.1
  • 2
    • 0031640944 scopus 로고    scopus 로고
    • A self-reference read scheme for a 1T/1C FeRAM
    • J. Yamada et al., "A self-reference read scheme for a 1T/1C FeRAM," in Symp. VLSI Circuits Dig. Tech. Papers, 1998, pp. 238-241.
    • (1998) Symp. VLSI Circuits Dig. Tech. Papers , pp. 238-241
    • Yamada, J.1
  • 3
    • 0029715114 scopus 로고    scopus 로고
    • 2 V/100 ns 1T/1C nonvolatile ferroelectric memory architecture with bitline-driven read scheme & nonrelaxation reference cell
    • H. Hirano et al., "2 V/100 ns 1T/1C nonvolatile ferroelectric memory architecture with bitline-driven read scheme & nonrelaxation reference cell," in Symp. VLSI Circuits Dig. Tech. Papers, 1996, pp. 48-49.
    • (1996) Symp. VLSI Circuits Dig. Tech. Papers , pp. 48-49
    • Hirano, H.1
  • 5
    • 18244414879 scopus 로고    scopus 로고
    • Demonstration of a 4 Mb, high density ferroelectric memory embedded within a 130 nm, 5 LM Cu/FSG logic process
    • T. S. Moise et al., "Demonstration of a 4 Mb, high density ferroelectric memory embedded within a 130 nm, 5 LM Cu/FSG logic process," in IEDM Tech. Dig., 2002, pp. 535-538.
    • (2002) IEDM Tech. Dig. , pp. 535-538
    • Moise, T.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.