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Volumn 2, Issue , 2003, Pages 1123-1127
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CDF run IIb silicon: Stave design and testing
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Author keywords
[No Author keywords available]
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Indexed keywords
AXIAL SENSORS;
ELECTRICAL DETECTING;
SILICON VERTEX DETECTORS (SVX);
STEREO SENSORS;
DETECTORS;
ETHYLENE;
MICROPROCESSOR CHIPS;
OPTIMIZATION;
PRODUCT DESIGN;
RADIATION;
SILICON SENSORS;
SILICON;
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EID: 11944262912
PISSN: 10957863
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (3)
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