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Volumn 21, Issue 1, 2005, Pages 172-177

Langmuir-Schaefer films of nafion with incorporated TiO2 nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; IONOMERS; NANOSTRUCTURED MATERIALS; PHASE INTERFACES; THERMODYNAMIC STABILITY; TITANIUM DIOXIDE; ULTRATHIN FILMS;

EID: 11844280316     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la048837l     Document Type: Article
Times cited : (29)

References (59)
  • 39
    • 0003977197 scopus 로고
    • Conway, B. A., White, R. E., Bockris, J. O'M, Eds.; Plenum Press: New York, Chapter 6
    • Yeo, R. S.; Yeager, H. L. In Modern Aspect of Electrochemistry; Conway, B. A., White, R. E., Bockris, J. O'M, Eds.; Plenum Press: New York, 1985; Vol. 16, Chapter 6, p 454.
    • (1985) Modern Aspect of Electrochemistry , vol.16 , pp. 454
    • Yeo, R.S.1    Yeager, H.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.