Vertex detection in a stack of Si-drift detectors for high resolution gamma - Ray imaging

IEEE Nuclear Science Symposium Conference Record

Volumn 3, Issue , 2003, Pages 1815-1818

  Walenta, A H ^a,d   Brill, A ^d   Castoldi, A ^c   Conka Nurdan, T ^a   Guazzoni, C ^c   Hartmann, K ^a   Longoni, A ^c   Nuidan, K ^a   Struder L ^a,b  

^a UNIVERSITY OF SIEGEN   (Germany)

^b MPE   (Germany)

^c POLITECNICO DI MILANO   (Italy)

^d VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CAMERAS; DRIFT CHAMBERS; GAMMA RAYS; MATERIALS SCIENCE; MEDICAL IMAGING; MICROPROCESSOR CHIPS; OPTICAL RESOLVING POWER; SILICON; VLSI CIRCUITS;

GAMMA INTERACTIONS; GAMMA RAY IMAGING; SILICON DETECTORS; TIME PROJECTION CHAMBER (TPC);

RADIATION DETECTORS;

EID: 11844259421     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nssmic.2003.1352231     Document Type: Conference Paper

References (2)

1. Gebier, Mathias, "Messung der Ejektionsriohtung von Compton - Elektronen für die Bildrekonstruktion mit einer Compton-Kamera nach dem TEC-Prinzip", Thesis, Siegen 1990
2. Castoldi, A. Gatt, E. Guazzoni, Ch, Longoni, A. Rehak, P and Strüder, L. "The Controlled Drift Detector", Nucl. Instr. Meth. A439 (2000), 519.