Viable image analyzing method to characterize the microstructure and the properties of the Ni/YSZ cermet anode of SOFC

Journal of Power Sources

Volumn 140, Issue 2, 2005, Pages 226-234

  Lee, K R ^a   Choi, S H ^a   Kim, J ^a   Lee, H W ^a   Lee, J H ^a  

^a Korea Institute of Science and Technology   (South Korea)

Author keywords

Image analysis; Microstructure analysis; Ni YSZ anode; SOFC

Indexed keywords

ANODES; BACKSCATTERING; CHARACTERIZATION; DIFFUSION; EPOXY RESINS; IMAGE ANALYSIS; MICROSTRUCTURE; NICKEL COMPOUNDS; OPTICAL MICROSCOPY; POROSITY; SCANNING ELECTRON MICROSCOPY; SOLID OXIDE FUEL CELLS; SPUTTER DEPOSITION; STEREOCHEMISTRY; SUBSTRATES; THICKNESS CONTROL;

COATED INTERFERENCE; GAS PERMEABILITY; MICROSTRUCTURE ANALYSIS; UNI-AXIAL PRESSING;

CERMETS;

EID: 11844251144     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2004.06.031     Document Type: Article

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