Transient inversion XUV-lasers in Ti and Ge

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3156, Issue , 1997, Pages 80-85

  Nickles, Peter V ^a   Schnürer, Matthias ^a   Kalachnikov, Mikhail P ^a   Sandner, Wolfgang ^a   Shlyaptsev, Vyacheslav N ^b   Danson, Colin N ^c   Neely, David ^c   Wolfrum, E ^c   Zhang, Jie ^c   Behjat, A ^d   Demir, A ^d   Tallents, Gregory J ^d   Warwick, P J ^e   Lewis, Ciaran L S ^e  

^a MAX BORN INSTITUT   (Germany)

^b Department of Environmental and Radiological Health Sciences   (United States)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^d UNIVERSITY OF ESSEX   (United Kingdom)

^e QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

Soft X ray laser; Table top system; Transient excitation

Indexed keywords

GERMANIUM; HEATING; LASER BEAM EFFECTS; LASER EXCITATION; LASERS; PUMPING (LASER); PUMPS; X RAYS;

GAIN SATURATION; LONG PULSES; OUTPUT ENERGY; PICO SECOND PULSES; PUMP ENERGIES; SOFT X-RAY LASER; TABLE TOP SYSTEM; TRANSIENT EXCITATION; TRANSIENT INVERSIONS;

X RAY LASERS;

EID: 11744384842     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.279405     Document Type: Conference Paper

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