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Volumn 38, Issue 8, 1988, Pages 5272-5280

Quantum size and surface effects in the electrical resistivity and high-energy electron reflectivity of ultrathin lead films

(2) Jalochowski, M a Bauer, E b

a MARIA CURIE SK ODOWSKA UNIVERSITY (Poland)

b CLAUSTHAL UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11744358243 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.38.5272 Document Type: Article

Times cited : (172)

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