Level-set methods for the simulation of epitaxial phenomena

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 58, Issue 6, 1998, Pages R6927-R6930

  Gyure, Mark F ^a   Ratsch, Christian ^a,b   Merriman, Barry ^b   Caflisch, Russel E ^b   Osher, Stanley ^b   Zinck, Jennifer J ^a   Vvedensky, Dimitri D ^a,b  

^a Hughes Aircraft Co   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11744291759     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.58.R6927     Document Type: Article

References (29)

1. A.-L. Barabasi and H. E. Stanley, Comput. Mater. Sci. 6, No. 2 (1996).
2. A.-L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, England, 1995).
3. J. A. Venables, G. D. T. Spiller, and M. Hanbücken, Rep. Prog. Phys. 47, 399 (1984).
4. R. Kariotis and M. G. Lagally, Surf. Sci. 216, 557 (1989).
5. J. Villain, J. Phys. I 1, 19 (1991).
6. D. D. Vvedensky, A. Zangwill, C. N. Luse, and M. R. Wilby, Phys. Rev. E 48, 852 (1993).
7. D. E. Wolf, Phys. Rev. Lett. 67, 1783 (1991);
8. E. Frey and U. C. Tauber, Phys. Rev. E 50, 1024 (1994)
9. ET. Sun and M. Plischke, Phys. Rev. 50, 3370 (1994).
10. A. W. Hunt, C. Orme, D. R. M. Williams, B. G. Orr, and L. M. Sander, Europhys. Lett. 27, 611 (1994);
11. L. Golubovic, Phys. Rev. Lett. 78, 90 (1997).
12. J. D. Weeks and G. H. Gilmer, Adv. Chem. Phys. 40, 157 (1979);
13. S. Clarke and D. D. Vvedensky, Phys. Rev. Lett. 58, 2235 (1987);
14. A. Madhukar and S. V. Ghaisas, CRC Crit. Rev. Solid State Mater. Sci. 14, 1 (1988);
15. H. Metiu, Y.-T. Lu, and Z. Y. Zhang, Science 255, 1088 (1992).
16. C. Ratsch, P. Ruggerone, and M. Scheffler, in Surface Diffusion: Atomistic and Collective Processes, edited by M. C. Tringides (Plenum, New York, 1997), pp. 83–101.
17. J. Y. Tsao, Materials Fundamentals of Molecular Beam Epitaxy (Academic Press, Boston, 1993).
18. S. Osher and J. A. Sethian, J. Comput. Phys. 79, 12 (1988).
19. S. Chen, B. Merriman, S. Osher, and P. Smereka, J. Comput. Phys. 135, 8 (1997).
20. M. Sussman, P. Smereka, and S. Osher, J. Comput. Phys. 114, 146 (1994);
21. D. Peng, B. Merriman, S. Osher, H. K. Zhao, and M. Kang (unpublished).
22. C.-W. Shu and S. Osher, J. Comput. Phys. 83, 32 (1989);
23. S. Osher and C.-W. Shu, SIAM (Soc. Ind. Appl. Math.) J. Numer. Anal. 28, 12 (1991).
24. D. Juric and G. Tryggvason, J. Comput. Phys. 123, 127 (1996).
25. J. G. Amar and F. Family, Thin Solid Films 272, 208 (1996).
26. M. C. Bartelt and J. W. Evans, Phys. Rev. B 54, R17 359 (1996).
27. R. E. Caflisch, M. F. Gyure, B. Merriman, S. Osher, C. Ratsch, D. D. Vvedensky, and J. J. Zinck, Appl. Math. Lett. (to be published).
28. M. C. Bartelt and J. W. Evans, Phys. Rev. B 46, 12 675 (1992).
29. J. A. Blackman and A. Wilding, Europhys. Lett. 16, 115 (1991).