Testing for convexity with Fourier descriptors

Electronics Letters

Volumn 34, Issue 14, 1998, Pages 1392-1393

  Kakarala, R ^a  

^a UNIVERSITY OF AUCKLAND   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL GEOMETRY; IMAGE PROCESSING;

FOURIER DESCRIPTORS;

FOURIER TRANSFORMS;

EID: 11744278236     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980943     Document Type: Article

References (5)

1. KIRYATI, N., and MAYDAN, D.: 'Calculating geometric properties from Fourier representation', Pattern Recognit., 1989, 22, (5), pp. 469-475
2. YIP, R.K.K., TAM, P.K.S., and LEUNG, D.N.K.: 'Application of elliptic Fourier descriptors to symmetry detection under parallel projection', IEEE Trans. Pattern Analy. Mach. Intell., 1994, 16, (3), pp. 277-286
3. KWOK, S.K.W., and POON, J.C.H.: 'Viewpoint-invariant Fourier descriptors for 3D planar shape representation', Electron. Lett., 1996, 32, pp. 1775-1776
4. RONSE, C.: 'A bibliography on digital and computational convexity (1961-1988)', IEEE Trans. Pattern Anal. Mach. Intell., 1989, 11, (2), pp. 181-190
5. DO CARMO, M.P.: 'Differentiable geometry of curves and surfaces' (Prentice-Hall, Englewood Cliffs, NJ, 1976)