Interrogation of nanoscale silicon dioxide/water interfaces via Hyper-Rayleigh scattering

Journal of Physical Chemistry B

Volumn 102, Issue 11, 1998, Pages 1845-1848

  Vance, Fredrick W ^a   Lemon, Buford I ^a   Ekhoff, Jessica A ^a   Hupp, Joseph T ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11644325572     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9800261     Document Type: Article

References (33)

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33. 2).