Focusing through an interface: Scanning and localizing the intensity

Optics Letters

Volumn 23, Issue 6, 1998, Pages 415-417

  Wiersma, S H ^a   Visser, T D ^a   Torok P ^b  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; IMAGING TECHNIQUES; LENSES; LIGHT TRANSMISSION; LITHOGRAPHY; NUMERICAL METHODS; THREE DIMENSIONAL;

FRESNEL TRANSMISSION COEFFICIENTS; THREE DIMENSIONAL IMAGING;

FOCUSING;

EID: 11644303550     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.23.000415     Document Type: Article

References (5)

1. P. Török, P. Varga, Z. Laczik, and G. R. Booker, J. Opt. Soc. Am. A 12, 325 (1995).
2. S. H. Wiersma and T. D. Visser, J. Opt. Soc. Am. A 13, 320 (1996).
3. S. H. Wiersma, P. Török, T. D. Visser, and P. Varga, J. Opt. Soc. Am. A 14, 1482 (1997).
4. V. Dhayalan, "Focusing on Electromagnetic waves," Ph.D. dissertation (University of Bergen, Bergen, Norway, 1996).
5. M. Born and E. Wolf, Principles of Optics, 6th ed. (Cambridge U. Press, Cambridge, 1997).