Defect of nanocrystalline copper and silver

Science in China, Series B: Chemistry

Volumn 41, Issue 1, 1998, Pages 30-35

  Zhang, Zhikun ^a   Cui, Zuolin ^a   Hao, Chuncheng ^a   Dong, Lifeng ^a   Meng, Zhaoguo ^a   Yu, Liyan ^a  

^a QINGDAO UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Defect; Nanocrystalline metal

Indexed keywords

EID: 11644285967     PISSN: 10069291     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02875553     Document Type: Article

References (7)

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4. Naidu, S. V., Houska, C. R., Smoothing and differentiation of data by simplified least squares procedures, J. Appl. Crystallogr., 1980, 15: 190.
5. Wagner, C. N. J., Stacking faults by low-temperature cold work in copper and alpha brass, Acta Metallurgica, 1957, 5: 427.
6. Wang, Y. M., Zhang, Z. K., X-ray line profile analysis of dislocations and stacking faults in deformed copper, Appl. Phys., 1984, A35:109.
7. Zhang, Z. K., Wang, Y. M., Dislocations in deformed aluminum alloy, Powder Diffraction, 1988, 3(3): 138.