Micro-Raman and electron microscopy analysis of cubic GaN layers on (001) GaAs

Materials Science Forum

Volumn 264-268, Issue PART 2, 1998, Pages 1367-1370

  Tabata, A ^a   Enderlein, R ^a   Lima, A P ^a   Leite, J R ^a   Lemos, V ^b   Kaiser, S ^c   Schikora, D ^d   Schottker B ^d   Kohler U ^d   Lischka, K ^d  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

^c UNIVERSITY OF REGENSBURG   (Germany)

^d UNIVERSITY OF PADERBORN   (Germany)

Author keywords

Cubic GaN; Micro Raman

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRON MICROSCOPY; MOLECULAR BEAM EPITAXY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; STOICHIOMETRY; SUBSTRATES;

CUBIC GALLIUM NITRIDE LAYERS; MICRO RAMAN SPECTROSCOPY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 11644263790     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.264-268.1367     Document Type: Article

References (9)

1. H. Morkoc, S. Strite, G.B. Gao, M.E. Lin, B. Sverdlov and Ni. Burns, J. Appl. Phys. 76, 1363 (1994)
2. D. Schikora, M. Hankein, D.J. As, K. Lischka, A. Waag, T. Buhrolv, and F. Henneberger, Phys. Rev. B 54, R8381 (1996)
3. O. Brandt, H. Yang, B. Jenichen, Y. Suzuki, L. Däweritz, and K. Ploog, Phys. Rev. B 52, R 2253 (1995)
4. T.S. Cheng, L.C. Jenkins, S.E. Hooper, and C.T. Foxon, J.W. Orton, and D.E Lacklison, Appl. Phys. Lett. 66, 1509 (1996)
5. D.J. As, D. Schikora, A. Greiner, M. Lübbers, J. Mimkes, and K. Lischka, Phys. Rev. B 54, R 11118 (1996)
6. D.J. As, F. Schmilgus, C. Wang, B. Schöttker, D. Schikora, and K. Lischka, Appl. Phys. Lett., to be published, March 1997
7. A. Tabata, R. Enderlem, J.R. Leite, S.W. da Silva, J. Galzerani, D. Schikora, M. Kloidt, and K. Lischka, J. Appl. Phys. 79, 4137 (1996)
8. H. Siegle, L. Eckey, A. Hoffmann, C. Thomson, B.K. Meyer, D. Schikora, M. Hankeln, and K. Lischka, Solid State Commun. 96, 943 (1995)
9. M. Giehler, M. Ramsteiner, O. Brandt, H. Yang, K.-H. Ploog, Appl. Phys. Lett. 67, 733 (1995)