Chemical and environmental influences on copper/copper sulfate reference electrode half cell potential

Materials Performance

Volumn 37, Issue 5, 1998, Pages 24-29

  Pawel, S J ^a,d,e   Lopez, R J ^b,f,g   Ondak, E ^c,h,i  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Office of Pipeline Safety   (United States)

^c Office of Pipeline Safety   (United States)

^d UNIVERSITY OF TENNESSEE   (United States)

^e University of Tennessee ^*  (United States)

^f U S DEPARTMENT OF TRANSPORTATION   (United States)

^g UNIVERSITY OF HOUSTON   (United States)

^h US DOT   (United States)

ⁱ INDIANA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11644257551     PISSN: 00941492     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (1)

1. E.J. Ansuini, J.R. Dimond, MP 33, 11 (1994): p. 14.