Optimal burn-in for minimizing cost and multiobjectives

Microelectronics Reliability

Volumn 38, Issue 10, 1998, Pages 1577-1583

  Kim, K N ^a  

^a Catholic Kwandong University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11544374462     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00031-6     Document Type: Article

References (12)

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