Development of a thermal-neutron double-crystal diffractometer for USANS at NIST

Physica B: Condensed Matter

Volumn 241-243, Issue , 1997, Pages 189-191

  Drews, A R ^a   Barker, J G ^a   Glinka, C J ^a   Agamalian, M ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Microstructure characterization; Neutron instrumentation; Perfect crystal diffraction; Small angle scattering

Indexed keywords

CRYSTAL MICROSTRUCTURE; DIFFRACTOMETERS; NEUTRON DIFFRACTION; NEUTRON SCATTERING; NUCLEAR INSTRUMENTATION; PARTICLE BEAMS;

DOUBLE CRYSTAL DIFFRACTOMETER; NEUTRON INSTRUMENTATION; PERFECT CRYSTAL DIFFRACTION;

NEUTRON DIFFRACTION APPARATUS;

EID: 11544339720     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(97)00547-4     Document Type: Article

References (2)

1. D. Schwahn, A. Miksovsky, H. Rauch, E. Seidl, G. Zugarek. Nucl. Instr. and Meth. A 239 (1985) 229.
2. M. Agamalian, G.D. Wignall, R. Triolo, J. Appl. Crystallogr. 30 (1997) 345.