Analysis of defects in CdA Langmuir-Blodgett film using synchrotron X-ray radiation

Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 273-277

  Choi, Jeong Woo ^a   Cho, Kyung Sang ^a   Lee, Won Hong ^a   Lee, Man Sup ^b  

^a Sogang University   (South Korea)

^b Inha University   (South Korea)

Author keywords

Defect analysis; Genetic algorithm; Langmuir Blodgett film; Monte Carlo simulation; X ray reflectivity

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; COMPUTER SIMULATION; CORRELATION METHODS; CRYSTAL DEFECTS; DEPOSITION; GENETIC ALGORITHMS; MONTE CARLO METHODS; PHASE TRANSITIONS; PROBABILITY; SYNCHROTRON RADIATION; X RAY ANALYSIS;

SYNCHROTRON X RAY RADIATION; X RAY REFLECTIVITY;

LANGMUIR BLODGETT FILMS;

EID: 11544324571     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00643-9     Document Type: Article

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